发明名称 WAFER WITH IMPROVED SAWING LOOPS
摘要 In a wafer (1) with chips (2) and elongate separating zones (4) between the chips (2), each chip (2) comprises at least one sawing loop (6), which sawing loop (6) comprises two protecting strips (17, 18) projecting from a planar protecting layer (16) of the chip (2), wherein said protecting strips (17, 18) are widened by means of wider strip portions (26, 27, 28, 29) where they emerge from the planar protecting layer (16), and wherein the protecting strips (17, 18) and the planar protecting layer (16) are provided with weak spots (31, 32, 34) serving as envisaged breakage points.
申请公布号 KR20070038549(A) 申请公布日期 2007.04.10
申请号 KR20077003156 申请日期 2007.02.09
申请人 KONINKLIJKE PHILIPS ELECTRONICS N.V. 发明人 SCHEUCHER HEIMO
分类号 H01L21/78;H01L21/301 主分类号 H01L21/78
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