发明名称 Apparatus for and method of measuring jitter
摘要 A signal under measurement is band-limited, and frequency components around a fundamental frequency of the signal under measurement are extracted. Waveform data (approximated zero-crossing data) close to zero-crossing timings of the band-limited signal are sampled, and phase error data between the approximated zero-crossing points and the corresponding zero-crossing points of the signal under measurement are calculated from the approximated zero-crossing data to obtain a zero-crossing phase error data sequence delta[k]. Then an instantaneous period sequence T(k) of the signal under measurement is obtained from the zero-crossing phase error data and sampling intervals T<SUB>k,k+1 </SUB>of the approximated zero-crossing data sequence. Then a period jitter sequence is obtained from differences between the T(k) and a fundamental period T<SUB>0 </SUB>of the signal under measurement, and then the period jitter sequence is multiplied by T<SUB>0</SUB>/T<SUB>k,k+1 </SUB>to correct the period jitter sequence.
申请公布号 US7203229(B1) 申请公布日期 2007.04.10
申请号 US20010882290 申请日期 2001.06.14
申请人 ADVANTEST CORPORATION 发明人 ISHIDA MASAHIRO;YAMAGUCHI TAKAHIRO;SOMA MANI
分类号 H04B17/00;G01R13/02;G01R29/26;G01R31/317 主分类号 H04B17/00
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