Apparatus and Method for Testing Signal Path Using Data Memory in Time Slot Interchange Device,申请号KR20050015566-传众专利搜索

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发明名称	Apparatus and Method for Testing Signal Path Using Data Memory in Time Slot Interchange Device
摘要
申请公布号	KR100705569(B1)	申请公布日期	2007.04.10
申请号	KR20050015566	申请日期	2005.02.24
申请人		发明人
分类号	H04L12/26	主分类号	H04L12/26
代理机构		代理人
主权项
地址

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