| 摘要 |
There is described apparatus for measuring uniformity of a laminar material ( 1 ) as the material is delivered from a laminar material delivery machine ( 2 ), the apparatus has a measurement rig ( 10 ) arranged across the width of the laminar material. The measurement rig carries a linear array of light sources ( 21 ) arranged to direct light onto the laminar material ( 1 ), a linear array of optical sensors ( 20 ), each optical sensor ( 20 ) being paired with a light source ( 21 ) and being configured to receive light reflected by the laminar material ( 1 ) from at least the light source ( 21 ) with which it is paired and to thereafter produce a signal indicative of the amount of reflected light it receives, and a processor ( 11 ) for receiving signals from each of the optical sensors ( 20 ) and processing each of the signals to produce measures of uniformity of the linear material ( 1 ) for each optical sensor ( 20 ), whereby said apparatus produces measures of uniformity related to spaced apart locations across the width of the laminar material ( 1 ).
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