Measuring device e.g. for measuring work piece, has height measurement h1 having first surface and first surface deviating second surface with first lighting unit provided and light line with width -B1 projects on first surface

摘要

The measuring device has a height measurement h1 having a first surface (1.1) and a first surface deviating second surface (1.2) with a first lighting unit (2) provided. A light line (2.1) with a width -B1 projects on the first surface. A camera (3) records the light line projected on the workpiece (1) for evaluation by an image processing system (6). The lighting unit is provided so that the first surface is lit up more intensively than the second surface and the height measurement and length (l1) of the first surface of project part (L1.1) of the light line is determined. An independent claim is included for a method.