发明名称 Lithographic apparatus temperature compensation
摘要 A lithographic apparatus includes a position measurement system to determine along a measurement path a position of a first part of the lithographic apparatus with respect to a position of a second part of the lithographic apparatus. The position determination system comprises a plurality of temperature sensors to measure a temperature of a medium along the measurement path. The position measurement system corrects the determined position making use of the temperature as measured by the temperature sensors.
申请公布号 US2007076218(A1) 申请公布日期 2007.04.05
申请号 US20050242130 申请日期 2005.10.04
申请人 ASML NETHERLANDS B.V. 发明人 VAN EMPEL TJARKO A.R.;BEEMS MARCEL H.M.;EUSSEN EMIEL J.M.
分类号 G01B11/02 主分类号 G01B11/02
代理机构 代理人
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