| 摘要 |
An integrated circuit arrangement including at least one circuit part which is designed to run through a functional self test and to output test results of the functional self test, and a testing unit, which is coupled to an input and an output and which is coupled to the at least one circuit part via testing lines. The testing unit is designed to start the functional self test when a starting signal for the functional self test is applied to the input, to evaluate test results that are present to determine whether they have a predefined relationship with predefined values, and to output data indicating the test result at the output. The testing unit is also designed to start the functional self test by internal circuit means and to evaluate the test results present.
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