发明名称 METHOD OF TESTING ELECTRO-OPTICAL DEVICE, DEVICE FOR TESTING THE ELECTRO-OPTICAL DEVICE AND METHOD OF MANUFACTURING THE ELECTRO-OPTICAL DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a test device and a test method capable of measuring two-dimensional light distribution of monochromatic light, using a light source that emits white light. SOLUTION: The test method includes a first process for transmitting the white light through a color filter for obtaining monochromatic light, a second process for introducing the monochromatic light in an electro-optical device and transmitting the display surface of the electro-optical device, and a third process for receiving the monochromatic light having transmitted the display surface of the electro-optical device and measuring the two-dimensional light distribution which is light intensity distribution at the measuring point for the angle that a line connecting the measuring point on the display surface of the electro-optical device forms to the normal of the display surface of the electro-optical device. By transmitting the white light through the color filter using the processes, a monochromatic light is obtained from the white color so that, by receiving the monochromatic light that has transmitted through the display surface of the electro-optical device in the second process, the two-dimensional light intensity distribution for the monochromatic light can be measured in the third process. COPYRIGHT: (C)2007,JPO&INPIT
申请公布号 JP2007085893(A) 申请公布日期 2007.04.05
申请号 JP20050275192 申请日期 2005.09.22
申请人 SEIKO EPSON CORP 发明人 TATENO YOSHITAKE
分类号 G01M11/00;G01J1/00;G02F1/13 主分类号 G01M11/00
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