| 摘要 |
PROBLEM TO BE SOLVED: To provide a contact probe that easily assembles a number of microprobes and enables ample correspondence to the demands for narrowing of pitches of an electronic component. SOLUTION: The contact probe is a cantilever type contact probe having a tip end for contacting a surface to be measured, a spring section connected to the tip end, and a support section for supporting the tip end and the spring section. The tip end, spring section, and support section are elastically deformed, when the support section is pressed against the tip end to the surface to be measured, by the spring section, while keeping the abuttment of the tip end and the surface. The tip end is a plate structure, having a flat surface along the direction of elastic deformation, and thickness t<SB>1</SB>of the tip end and a thickness t<SB>2</SB>of the spring section are such that t<SB>1</SB><t<SB>2</SB>. COPYRIGHT: (C)2007,JPO&INPIT
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