| 摘要 |
PROBLEM TO BE SOLVED: To efficiently calculate remedial solutions for a plurality of memories under test. SOLUTION: This tester is equipped with: a plurality of test signal supply parts provided correspondingly to the respective memories under test; a plurality of defect detection parts provided correspondingly to the respective memories under test for detecting defects in the corresponding memories under test; a plurality of fail memories provided correspondingly to the respective memories under test for storing therein fail information for determining defective storage cells in the memories under test; a plurality of buffer parts provided correspondingly to the respective memories under test for DMA-transferring the fail information stored in the fail memories to a buffer memory; and a plurality of analyzing/processing parts provided correspondingly to respective groups each comprising two or more memories under test for finding the remedial solutions for remedying defects in the memories under test based on the fail information on memories under test in a relevant group transferred to the buffer memory. COPYRIGHT: (C)2007,JPO&INPIT
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