| 摘要 |
PROBLEM TO BE SOLVED: To provide a high-frequency device measurement tool for performing measurement on a wafer-like or sheet-like high-frequency device at a low cost. SOLUTION: This high-frequency device measurement tool used for measurement on a high-frequency device is equipped with: a printed board 4 with contact surfaces 11a, 11b, and 11c, and transmission paths 12a, 12b, and 12c formed thereon, the contact surfaces 11a, 11b, and 11c making contact with electrodes of the high-frequency device and the transmission paths 12a, 12b, and 12c being connected to the contact surfaces 11a to 11c at their ends on one side thereof; an enclosure 3 for thereto fixing both end parts of the printed board 4; and a bar for tension adjustment for pressing the printed board 4 from its back surface side so that the contact surfaces 11 formed on the printed board 4 project to the front surface side of the printed board 4. COPYRIGHT: (C)2007,JPO&INPIT
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