发明名称 |
ANTIREFLECTIVE HARD MASK COMPOSITION |
摘要 |
<P>PROBLEM TO BE SOLVED: To provide a new composition and a new method for manufacturing an integrated circuit. <P>SOLUTION: The invention includes new organic-containing compositions that can function as an antireflective layer for an overcoated photoresist. Compositions of the invention also can serve effectively as a hard mask layer by exhibiting a sufficient plasma etch selectivity from an undercoated layer. Preferred compositions of the invention have a high Si content and comprise a blend of distinct resins. <P>COPYRIGHT: (C)2007,JPO&INPIT |
申请公布号 |
JP2007086773(A) |
申请公布日期 |
2007.04.05 |
申请号 |
JP20060230230 |
申请日期 |
2006.08.28 |
申请人 |
ROHM & HAAS ELECTRONIC MATERIALS LLC |
发明人 |
GRONBECK DANA A;AMY M KUOKKU;TRUONG CHI Q;GALLAGHER MICHAEL K;ZAMPINI ANTHONY |
分类号 |
G03F7/11;H01L21/027;H01L21/3065 |
主分类号 |
G03F7/11 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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