发明名称 Stencil masks, method of manufacturing stencil masks, and method of using stencil masks
摘要 The present invention presents a stencil mask in which various surface patterns can be formed, and in which deformation is suppressed when charged particles are introduced. A stencil mask of the present invention is provided with a semiconductor stack. A first penetrating hole corresponding to an ion introducing area is formed in a first semiconductor layer of the semiconductor stack, and second penetrating holes are formed in a second semiconductor layer, these second penetrating holes having a width greater than the width of the first penetrating hole. The first penetrating hole and the second penetrating holes communicate and pass through the semiconductor stack. Beam members extending between adjacent second penetrating holes connect portions of the first semiconductor layer separated by the first penetrating hole.
申请公布号 US2007077501(A1) 申请公布日期 2007.04.05
申请号 US20060496552 申请日期 2006.08.01
申请人 TOYOTA JIDOSHA KABUSHIKI KAISHA 发明人 NISHIWAKI TSUYOSHI;TOJIMA HIDEKI
分类号 A61N5/00;G03C5/00;G03F1/20;G03F1/68;G21G5/00;H01L21/266 主分类号 A61N5/00
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