发明名称 Semiconductor integrated circuit apparatus and interface test method
摘要 An interface test can be performed by, for example, only a self apparatus when interface operation specifications are different between the self apparatus and an original connection partner apparatus. An LSI has a plurality of interfaces (IFs) for transmission/reception of data with an external device, and the LSI includes an emulation control unit for allowing one of the two of the plurality of IFs to perform an operation of emulating an IF of a connection partner device having operation specifications different from those of the LSI, when two Ifs are connected each other via a transmission line.
申请公布号 US2007079198(A1) 申请公布日期 2007.04.05
申请号 US20050319515 申请日期 2005.12.29
申请人 FUJITSU LIMITED 发明人 KOMURA KAZUFUMI
分类号 G01R31/28 主分类号 G01R31/28
代理机构 代理人
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