发明名称 Production of a semiconductor component used in the production of integrated circuits comprises selectively forming a first etch stop layer over a first or second transistor element and forming a second contact etch stop layer
摘要 <p>Production of a semiconductor component (250) comprises selectively forming a first etch stop layer over a first or second transistor element (200n, 200p), forming a first contact etch stop layer (216) over the transistor elements, selectively removing a region of the contact stop layer and forming a second contact etch stop layer (219) over the transistor elements. An independent claim is also included for a semiconductor component produced using the above process.</p>
申请公布号 DE102005046978(A1) 申请公布日期 2007.04.05
申请号 DE20051046978 申请日期 2005.09.30
申请人 ADVANCED MICRO DEVICES INC. 发明人 FROHBERG, KAI;PETERS, CARSTEN;SCHALLER, MATTHIAS;SALZ, HEIKE
分类号 H01L21/8238;H01L27/092 主分类号 H01L21/8238
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