发明名称 ORGANIC MEMORY DEVICE COMPRISING ACTIVE MEMORY REGION FORMED IN EMBOSSED STRUCTURE
摘要 <P>PROBLEM TO BE SOLVED: To provide an organic memory device with improved reliability by reducing the variance and length of switching delay time. <P>SOLUTION: This organic memory device comprises a substrate, a first electrode formed on the substrate, an organic memory layer formed on the first electrode, a second electrode formed on the organic memory layer, and an embossed structure forming an active memory region in the organic memory layer. The embossed structure is composed of uniform size organic or inorganic particles distributed between the substrate and the first electrode. The diameter of the particles is from 10 nm to 500 nm. <P>COPYRIGHT: (C)2007,JPO&INPIT
申请公布号 JP2007088438(A) 申请公布日期 2007.04.05
申请号 JP20060222693 申请日期 2006.08.17
申请人 SAMSUNG ELECTRONICS CO LTD 发明人 JOO WON JAE;LEE KWANG HEE;LEE SANG-KYUN;CHOI TAE LIM
分类号 H01L27/28;H01L27/10;H01L51/05 主分类号 H01L27/28
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