Spatially-resolved analysis of electron spin polarization in beam path of parallel-focusing electron microscope, by displaying lateral distribution of degree of spin polarization of electrons on image detector

摘要

The method involves using a polarization-sensitive scattering target to simultaneous analyze the lateral distribution of spin polarization degree of the electrons in the beam, and display it on the image detector of the microscope. The scattering target and a beam guidance system are positioned and adjusted so that a spin-filtered electron-optical image of the sample is shown on the screen or the image detector of the microscope. Independent claims are included for apparatus for carrying out the method, and for a further method.