发明名称 DOUBLE GATE NON-VOLATILE MEMORY DEVICE AND METHOD OF MANUFACTURING
摘要 <p>The present invention relates to a non- volatile memory device on a substrate layer comprising semiconductor source and drain regions, a semiconductor channel region, a charge storage stack and a control gate; the channel region being fin-shaped having two sidewall portions and a top portion, and extending between the source region and the drain region; the charge storage stack being positioned between the source and drain regions and extending over the fin-shaped channel, substantially perpendicularly to the length direction of the fin- shaped channel; the control gate being in contact with the charge storage stack, wherein - an access gate is provided adjacent to one sidewall portion and separated therefrom by an intermediate gate oxide layer, and - the charge storage stack contacts the fin-shaped channel on the other sidewall portion and is separated from the channel by the intermediate gate oxide layer.</p>
申请公布号 WO2007036876(A1) 申请公布日期 2007.04.05
申请号 WO2006IB53491 申请日期 2006.09.26
申请人 KONINKLIJKE PHILIPS ELECTRONICS N.V.;DOORNBOS, GERBEN;GOARIN, PIERRE 发明人 DOORNBOS, GERBEN;GOARIN, PIERRE
分类号 H01L21/28;H01L21/336;H01L29/423;H01L29/788;H01L29/792 主分类号 H01L21/28
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