发明名称 |
DOUBLE GATE NON-VOLATILE MEMORY DEVICE AND METHOD OF MANUFACTURING |
摘要 |
<p>The present invention relates to a non- volatile memory device on a substrate layer comprising semiconductor source and drain regions, a semiconductor channel region, a charge storage stack and a control gate; the channel region being fin-shaped having two sidewall portions and a top portion, and extending between the source region and the drain region; the charge storage stack being positioned between the source and drain regions and extending over the fin-shaped channel, substantially perpendicularly to the length direction of the fin- shaped channel; the control gate being in contact with the charge storage stack, wherein - an access gate is provided adjacent to one sidewall portion and separated therefrom by an intermediate gate oxide layer, and - the charge storage stack contacts the fin-shaped channel on the other sidewall portion and is separated from the channel by the intermediate gate oxide layer.</p> |
申请公布号 |
WO2007036876(A1) |
申请公布日期 |
2007.04.05 |
申请号 |
WO2006IB53491 |
申请日期 |
2006.09.26 |
申请人 |
KONINKLIJKE PHILIPS ELECTRONICS N.V.;DOORNBOS, GERBEN;GOARIN, PIERRE |
发明人 |
DOORNBOS, GERBEN;GOARIN, PIERRE |
分类号 |
H01L21/28;H01L21/336;H01L29/423;H01L29/788;H01L29/792 |
主分类号 |
H01L21/28 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|