发明名称 PARTICLE COMPONENT MEASURING METHOD AND PARTICLE COMPONENT MEASURING DEVICE
摘要 PROBLEM TO BE SOLVED: To allow a measuring object material to efficiently absorb laser light, to properly apply also to a particle having a nano-order particle size, and to simultaneously measure a plurality of components. SOLUTION: In this particle component measuring method, a filament 14 generated by irradiating ultrashort pulsed laser beam 15 is irradiated to particles, such as nanoparticles or microparticles to generate a plasma, and a particle component is measured based on the emission spectrum from the plasma. COPYRIGHT: (C)2007,JPO&INPIT
申请公布号 JP2007085790(A) 申请公布日期 2007.04.05
申请号 JP20050272665 申请日期 2005.09.20
申请人 CENTRAL RES INST OF ELECTRIC POWER IND 发明人 FUJII TAKASHI;GOTO NAOHIKO;MIKI MEGUMI;NAYUKI TAKUYA;NEMOTO KOSHICHI;TANAKA NOBUYUKI
分类号 G01N21/63 主分类号 G01N21/63
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