| 摘要 |
The present invention discloses methods for manufacturing chip resistor networks, which are free from the short circuit owing to electron migration of the silver electrodes. In one embodiment of the present invention, a barrier layer is formed to prevent the silver electrodes from electron migration. In another embodiment of the present invention, copper or nickel electrodes are formed to replace silver electrodes. These methods for manufacturing chip resistor networks are the ways to solve the short circuit caused by electron migration of the silver electrodes.
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