发明名称 |
Production of an integrated semiconductor circuit arrangement comprises forming a semiconductor circuit with first type field effect transistors and forming lateral edge regions to protect the gate insulation below the gate electrodes |
摘要 |
<p>Production of an integrated semiconductor circuit arrangement (10) comprises forming a semiconductor circuit (30) with first type field effect transistors (T1) each having a first lateral gate insulation (GOX1) and a first lateral gate electrode (G1) arranged over the gate insulation and forming lateral edge regions with spacer elements (40s) to protect the gate insulation below the gate electrodes. The spacer elements are formed by producing a material layer, implanting the spacer elements and selectively etching the material layer so that lateral regions of the material layer are removed and the remainder of the material layer remains on the lateral edge regions. An independent claim is also included for an integrated semiconductor circuit arrangement produced by the above process.</p> |
申请公布号 |
DE102005046403(A1) |
申请公布日期 |
2007.04.05 |
申请号 |
DE20051046403 |
申请日期 |
2005.09.28 |
申请人 |
INFINEON TECHNOLOGIES AG |
发明人 |
HARTNER, WALTER;GRUBER, HERMANN |
分类号 |
H01L21/8232 |
主分类号 |
H01L21/8232 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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