发明名称 Semiconductor device
摘要 A substrate is provided with a first wiring layer , an interlayer insulating film on the first wiring layer 111, a hole formed in the interlayer insulating film, a first metal layer covering the hole , a second metal layer formed in the hole , a dielectric insulating film on the first metal layer , and second wiring layers on the dielectric insulating film , wherein the first metal layer constitutes at least part of the lower electrode, an area, facing the lower electrode, of the second wiring layers constitutes the upper electrode, and a capacitor is constructed of the lower electrode, the dielectric insulating film and the upper electrode.
申请公布号 EP1770764(A2) 申请公布日期 2007.04.04
申请号 EP20060001359 申请日期 2006.01.23
申请人 FUJITSU LIMITED 发明人 WATANABE, KENICHI
分类号 H01L21/02;H01L23/522 主分类号 H01L21/02
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