发明名称 X-ray Inspection system
摘要 <p>An x-ray inspection system (198) arranged to inspect at least one object and comprising: a source of radiation (200) a detector (216), in use, capable of detecting the radiation passing through an irradiation zone (214) and generating a periodic output of data therefrom; processing circuitry arranged to process the output generated by the detector (216); a speed determination means (228) arranged, in use, to determine and output to the processing circuitry the speed at which an object passes the detector (216); wherein the processing circuitry is arranged to vary the period of the output of the detector (216) according to the output from the speed determination means (228). To be accompanied with Figure 4 of the specification when published.</p>
申请公布号 EP1770412(A2) 申请公布日期 2007.04.04
申请号 EP20060255043 申请日期 2006.09.29
申请人 METTLER-TOLEDO SAFELINE X-RAY LIMITED 发明人 GUSTERSON, STEVE
分类号 G01V5/00;G01N23/12 主分类号 G01V5/00
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