发明名称 Under-bump metallization layers and electroplated solder bumping technology for flip-chip
摘要 A series of improved processes and methods to manufacture solder bumps on the wafer which shrink the space among solder bumps and reduce the cost of manufacturing. A design method and a relevant manufacturing process are introduced to form an organic material or metal material layer, which is called a Bump-Reflow-Control Layer. The pad patterns can be defined by this method. A mechanical part is designed with a hermetic cover to improve the photoresist process. The series of photolithography process including the designing method of related photolithography mask is introduced to achieve the high quality and thick photoresist.
申请公布号 US7199036(B2) 申请公布日期 2007.04.03
申请号 US20040854174 申请日期 2004.05.27
申请人 THE HONG KONG UNIVERSITY OF SCIENCE AND TECHNOLOGY 发明人 CHAN CHINGHO PHILIP;XIAO GUOWEI DAVID
分类号 H01L21/44;C25D7/12;H01L21/60;H01L23/02;H01L23/485 主分类号 H01L21/44
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