发明名称 SEMICONDUCTOR MEMORY DEVICE WITH TRIPPLE WELL STRUCTURE AND METHOD OF MANUFACTURING THE SAME
摘要 A semiconductor memory device may include a semiconductor substrate that may have a first conductivity type. A first buried layer may be formed in the semiconductor substrate and may have a second conductivity type opposite to the first type conductivity. A first well may be formed on the first buried layer and may have the first type conductivity. A second well may be formed in the first well over a first surface portion of the first buried layer and may have the second conductivity type. A second buried layer may be formed in the first well and on a second surface portion of the first buried layer and may have the first conductivity type. A third well may be formed in the first well and on the second buried layer and may have the second conductivity type.
申请公布号 KR100705336(B1) 申请公布日期 2007.04.03
申请号 KR20060001355 申请日期 2006.01.05
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 LEE, JUNG HWA;LEE, JAE YOUNG
分类号 H01L27/06;H01L21/336 主分类号 H01L27/06
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