发明名称 Method of manufacturing capacitor of semiconductor device by simplifying process of forming dielectric layer and apparatus therefor
摘要 In a method of manufacturing a capacitor of a semiconductor device and an apparatus therefor, dielectric layers are deposited using only a source gas without a reactant gas and a curing process is performed a single time. As a result, process simplification, yield improvement, and equipment simplification are achieved. In a stand-alone memory or an embedded memory, the step coverage is enhanced and oxidation of a storage node contact plug is prevented. Also, in an analog capacitor, an RF capacitor, or a high-voltage capacitor, which uses thicker dielectric layers than the stand-alone capacitor or the embedded capacitor, the manufacturing process is greatly simplified.
申请公布号 US7199003(B2) 申请公布日期 2007.04.03
申请号 US20030696465 申请日期 2003.10.29
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 JEONG YONG-KUK;YOON MYONG-GEUN;WON SEOK-JUN;KWON DAE-JIN
分类号 H01L21/8242;H01L27/04;H01L21/02;H01L21/31;H01L21/314;H01L21/316;H01L21/822;H01L27/108 主分类号 H01L21/8242
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