发明名称 |
Plating-rinse-plating process for fabricating copper interconnects |
摘要 |
An improved copper ECD process. After the copper seed layer ( 116 ) is formed, a first portion of copper film ( 118 ) is plated onto the surface of the seed layer ( 116 ). The surface of the first portion of the copper film ( 118 ) is then rinsed to equalize the organic adsorption on all sites to prevent preferential copper growth in dense areas. After rinsing, the remaining copper of the copper film ( 118 ) is electrochemically deposited.
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申请公布号 |
US7198705(B2) |
申请公布日期 |
2007.04.03 |
申请号 |
US20020325773 |
申请日期 |
2002.12.19 |
申请人 |
TEXAS INSTRUMENTS INCORPORATED |
发明人 |
CHEN LINLIN;LU JIONG-PING;XIA CHANGFENG |
分类号 |
C25D5/02;C25D5/48;C25D5/10;C25D7/12;H01L21/288;H01L21/3205;H01L21/768;H01L23/52 |
主分类号 |
C25D5/02 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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