发明名称 Plating-rinse-plating process for fabricating copper interconnects
摘要 An improved copper ECD process. After the copper seed layer ( 116 ) is formed, a first portion of copper film ( 118 ) is plated onto the surface of the seed layer ( 116 ). The surface of the first portion of the copper film ( 118 ) is then rinsed to equalize the organic adsorption on all sites to prevent preferential copper growth in dense areas. After rinsing, the remaining copper of the copper film ( 118 ) is electrochemically deposited.
申请公布号 US7198705(B2) 申请公布日期 2007.04.03
申请号 US20020325773 申请日期 2002.12.19
申请人 TEXAS INSTRUMENTS INCORPORATED 发明人 CHEN LINLIN;LU JIONG-PING;XIA CHANGFENG
分类号 C25D5/02;C25D5/48;C25D5/10;C25D7/12;H01L21/288;H01L21/3205;H01L21/768;H01L23/52 主分类号 C25D5/02
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