发明名称 Arrangement for determining a temperature loading of an integrated circuit and method
摘要 In an arrangement for determining a temperature loading during a soldering process, a semiconductor chip ( 1 ) comprises at least one contact ( 2 ) to be soldered or is electrically conductively connected to at least one contact ( 14 d) to be soldered that is situated outside the semiconductor chip. The semiconductor chip ( 1 ) furthermore comprises a temperature sensor device ( 3 ), which determines a measurement quantity corresponding to the temperature. A processing device ( 4, 5 ) has an analog-to-digital converter ( 5 ), which is electrically conductively connected to the temperature sensor device ( 3 ) and converts the measurement quantity into at least one storable signal that represents the temperature loading. A voltage supply device ( 10 ), which is electrically conductively connected to the temperature sensor device ( 3 ) and the processing device ( 4, 5 ), supplies these components with an operating voltage. A data memory ( 6 ) serves for storing the at least one storable signal. An electrical line ( 7, 11 ) connected to the data memory ( 6 ) serves for outputting the stored signal. As a result, it is possible to monitor temperature loadings of the semiconductor chip also outside the sphere of influence of the semiconductor manufacturer.
申请公布号 US7198403(B2) 申请公布日期 2007.04.03
申请号 US20040009969 申请日期 2004.12.10
申请人 INFINEON TECHNOLOGIES AG 发明人 PROELL MANFRED;AUGE JUERGEN;SCHROEDER STEPHAN;HUBER THOMAS
分类号 G01K7/00;G01K1/02;G01K7/01;H01L23/544 主分类号 G01K7/00
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