| 摘要 |
A test arrangement for testing the interconnections of an electronic circuit ( 100 ) and a further electronic circuit is provided. A first selection of I/O nodes ( 120 ), which are arranged to receive input data in a functional mode of the electronic circuit ( 100 ), and which are coupled to a test unit in a test mode of the electronic circuit ( 100 ). The test unit has a combinatorial circuit ( 160 ) for implementing a multiple-input XOR or XNOR gate. The test unit also provides interconnections between the first selection of I/O nodes ( 120 ) and a second selection of I/O nodes ( 130 ) via logic gates ( 141-144 ). These interconnections increase the interconnect test coverage of the electronic device ( 100 ), because the interconnects with the further electronic circuits that are associated with I/O nodes ( 131-134 ) become testable as well. |
