发明名称 SPECT examination device
摘要 A tomography device, particularly for single photon emission computed tomography (SPECT), comprises a multi-pinhole collimator and a detector for detecting gamma quanta or photons that penetrate the multi-pinhole collimator. In a tomographic method using the device, the distance between the object and the multi-pinhole collimator is selected to be smaller than the distance between the multi-pinhole collimator and the surface of the detector.
申请公布号 US7199371(B2) 申请公布日期 2007.04.03
申请号 US20040487700 申请日期 2004.07.07
申请人 SCIVIS GMBH 发明人 SCHRAMM NILS;HALLING HORST;EBEL GERNOT
分类号 G01T1/164 主分类号 G01T1/164
代理机构 代理人
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