发明名称 PHASE SHIFT MASK AND METHOD FOR MANUFACTURINGIN THE SAME
摘要 <p>A phase shift mask and a manufacturing method thereof are provided to improve a process margin and to obtain easily a fine pattern by improving the resolution. A multiple thin film structure(24) is formed on a substrate(21). The multiple thin film structure has a predetermined groove with a predetermined depth. An absorbing body(25) is partially filled in the predetermined groove. The multiple thin film structure is composed of lower and upper films, wherein the lower and upper films are alternately stacked with each other. A first thickness of the lower film is 2.8 nm and a second thickness of the upper film is 4.2 nm.</p>
申请公布号 KR100701424(B1) 申请公布日期 2007.03.30
申请号 KR20050130470 申请日期 2005.12.27
申请人 发明人
分类号 H01L21/027;G03F1/22;G03F1/24;G03F1/26;G03F1/30;G03F7/20 主分类号 H01L21/027
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