发明名称 NONVOLATILE SEMICONDUCTOR MEMORY DEVICE
摘要 <P>PROBLEM TO BE SOLVED: To provide a nonvolatile semiconductor memory device capable of reducing a peripheral circuit area while scaling of a memory cell. <P>SOLUTION: This device includes: a float gate; a plurality of memory cells arranged in a matrix; a first diode connected between the drain and the ground terminal of the plurality of memory cells; and a second diode connected between the source and the ground terminal of the plurality of memory cells. The first and second diodes have the same temperature characteristics. The first and second diodes are parasitic diodes, zener diodes or elements having avalanche breakdown voltages. <P>COPYRIGHT: (C)2007,JPO&INPIT
申请公布号 JP2007080306(A) 申请公布日期 2007.03.29
申请号 JP20050263031 申请日期 2005.09.09
申请人 TOSHIBA CORP 发明人 UMEZAWA AKIRA
分类号 G11C16/06;G11C16/04 主分类号 G11C16/06
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