发明名称 METHOD AND DEVICE FOR MANUFACTURING OF SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To prevent a deterioration of a reaction uniformity to a chemical in a semiconductor substrate surface, which is caused by a temperature distribution of the treatment chemicals on the semiconductor substrate surface when the semiconductor substrate is processed with the hot chemicals. SOLUTION: In the manufacturing method, a nozzle support arm 18 on which a plurality of chemical nozzles 4 which eject chemicals at the chemical processing temperature are mounted, corresponding to the plurality of different positions in the diametrical direction of the substrate 1, is arranged above the semiconductor substrate 1. The chemical is ejected from the plurality of chemical nozzles 4, while rotating the nozzle support arm 18 around an axis of rotation of the semiconductor substrate 1 for the reverse direction against the rotation direction of the semiconductor substrate 1. By rotating the surface of the semiconductor substrate 1, the high temperature chemical is supplied simultaneously on the plurality of different positions of the semiconductor substrate 1 in the diametrical direction. Thereby, the variation of the temperature of the chemical on the substrate surface is decreased, and the reaction uniformity of the chemical on the substrate surface can be enhanced. COPYRIGHT: (C)2007,JPO&INPIT
申请公布号 JP2007081432(A) 申请公布日期 2007.03.29
申请号 JP20060332916 申请日期 2006.12.11
申请人 MATSUSHITA ELECTRIC IND CO LTD 发明人 KOTANI TAKAFUMI;MIYOSHI YUICHI
分类号 H01L21/306;H01L21/304 主分类号 H01L21/306
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