发明名称 PARTICLE PROPERTY ANALYSIS DISPLAY DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a particle property analysis display device capable of shortening a decryption work by analyzing a particle image and displaying the particle property three-dimensionally. SOLUTION: This particle property analysis display device is equipped with a liquid flow forming means 2, an imaging means 10, an image analysis means 21, an image processing means 31, a display means 50 and an input means 40. The image analysis means 21 comprises a particle image cutting-out means 23 for cutting out each particle image from an imaged image, a particle size item data measuring means 24, a particle shape item data operation means 25, and a three-dimensional data statistical processing means 27 for totalizing two-dimensional frequencies wherein two kinds of specified items are used as two parameters. The image processing means 31 comprises a three-dimensional bar graph data conversion means 32 for displaying the totalized two-dimensional frequency wherein the two kinds of specified items are expressed in two orthogonal coordinate axes in a bar graph having one coordinate axis orthogonal to the two coordinate axes, and a two-dimensional display image conversion means 33 for acquiring image formation data by converting the three-dimensional bar graph data into two-dimensional display image data on a specific camera position. COPYRIGHT: (C)2007,JPO&INPIT
申请公布号 JP2007078590(A) 申请公布日期 2007.03.29
申请号 JP20050269024 申请日期 2005.09.15
申请人 SEISHIN ENTERPRISE CO LTD 发明人 OSUMI MICHIO;AGAWA NAOKI;SUZUKI TAKEHISA
分类号 G01N15/02 主分类号 G01N15/02
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