发明名称 METHOD OF PREPARING AN INTEGRATED CIRCUIT DIE FOR IMAGING
摘要 Integrated circuit dies are prepared for imaging by completely etching away all metal from the metal lines without removing barrier layers that underlie the metal lines. The metal vias may also be removed, especially if they are formed from the same metal as the metal lines, as in copper damascene circuits. This provides high contrast images that permits circuit layout extraction software to readily distinguish between metal lines and vias.
申请公布号 CA2521675(A1) 申请公布日期 2007.03.29
申请号 CA20052521675 申请日期 2005.09.29
申请人 CHIPWORKS INC. 发明人 KLIBANOV, LEV;GRIFFIN, SHERRI LYNN
分类号 H01L21/66;H01L21/302 主分类号 H01L21/66
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