发明名称 Method of fabricating strained-silicon transistors and strained-silicon CMOS transistors
摘要 A method of fabricating strained-silicon transistors includes providing a semiconductor substrate, in which the semiconductor substrate contains a gate structure thereon; performing an etching process to form two recesses corresponding to the gate structure within the semiconductor substrate; performing an oxygen flush on the semiconductor substrate; performing a cleaning process on the semiconductor substrate; and performing a selective epitaxial growth (SEG) to form an epitaxial layer in each recess for forming a source/drain region.
申请公布号 US2007072353(A1) 申请公布日期 2007.03.29
申请号 US20050162798 申请日期 2005.09.23
申请人 WU CHIH-NING;TAI HSIN;LEE CHUNG-JU;SHIAU WEI-TSUN 发明人 WU CHIH-NING;TAI HSIN;LEE CHUNG - JU;SHIAU WEI-TSUN
分类号 H01L21/8234;H01L21/336 主分类号 H01L21/8234
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