发明名称 Workpiece inspection apparatus, workpiece inspection method and computer-readable recording medium storing program
摘要 A workpiece inspection apparatus includes a search unit for finding from an input reference image a first pixel group which contains a certain pixel and a second pixel group having grayscale values within a threshold, and a probability acquisition unit responsive to receipt of an optical image of a workpiece being tested and the reference image, for obtaining a probability value based on a grayscale value of the certain pixel, a grayscale value of its corresponding pixel in the second pixel group, a grayscale value of an optical image pixel corresponding to the certain pixel, and a grayscale value of an optical image pixel corresponding to a pixel in the second pixel group corresponding to the certain pixel. The probability value is used to determine whether a defect exists at the optical image pixel corresponding to the certain pixel.
申请公布号 US2007071308(A1) 申请公布日期 2007.03.29
申请号 US20050299847 申请日期 2005.12.13
申请人 ADVANCED MASK INSPECTION TECHNOLOGY 发明人 NAKATANI YUICHI
分类号 G06K9/00;G01N21/956;G03F1/84;H01L21/027 主分类号 G06K9/00
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