发明名称 Methode und Vorrichtung für die Definition von Mustern einer Fotomaske mittels einer Booleschen Kombination der Designdaten mit skalierten Designdaten
摘要 A method of generating a mask for use in printing a target pattern on a substrate. The method includes the steps of: (a) determining a target pattern representing a circuit design to be printed on a substrate; (b) generating a first pattern by scaling the target pattern by a factor of 0.5; and (c) generating a second pattern by performing a Boolean operation which combines the target pattern and the first pattern. The second pattern is then utilized to print the target pattern on the substrate. <IMAGE>
申请公布号 DE60305377(T2) 申请公布日期 2007.03.29
申请号 DE2003605377T 申请日期 2003.03.25
申请人 ASML MASKTOOLS B.V. 发明人 VAN DER BROEKE, DOUGLAS;CHEN, JANG FUNG
分类号 G03F1/00;G03F7/20;G06F17/50;H01L21/027 主分类号 G03F1/00
代理机构 代理人
主权项
地址
您可能感兴趣的专利