发明名称 Conductior position inspection apparatus and conductor position inspection method
摘要 Disclosed is a conductor position inspection apparatus capable of detecting where an inspection-target electric conductor is located, with a high degree of accuracy in a non-contact manner. The inspection apparatus comprises a signal supply section 510 for supplying an AC inspection signal to an inspection-target conductor 520, two sensor plates 570, 580 disposed approximately parallel to each other in the vicinity of the conductor 520, a subtracter 550 for subjecting respective detected signal values from the sensor plates to subtraction, and a divider 560 for dividing the detected signal value from a selected one of the sensor plates by the subtraction result to normalize the detected signal value from the selected sensor plate so as to detect a relative ratio between the detected signal values from the sensor plates to obtain a value X corresponding a distance between the selected sensor plate and the conductor 520, as a detection result.
申请公布号 US2007073512(A1) 申请公布日期 2007.03.29
申请号 US20040547084 申请日期 2004.02.27
申请人 YAMAOKA SHUJI;NURIOKA AKIRA;HAYASHI MISHIO;ISHIOKA SHONGO 发明人 YAMAOKA SHUJI;NURIOKA AKIRA;HAYASHI MISHIO;ISHIOKA SHONGO
分类号 G01B7/00;G01C17/00;G01B7/287;G01C9/00;G01C19/00;G06F15/00 主分类号 G01B7/00
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