发明名称 Specimen analysis system obtaining characteristic of specimen by diffusion approximation
摘要 In a specimen analysis system: a light injection unit selectively injects unscattered light and scattered light into a specimen at an incident position on the specimen, and an information processing unit performs calculation of a characteristic of the specimen by diffusion approximation, where the calculation of the characteristic in a near-incident-point region located within a predetermined distance from the incident position is based on information carried by light which exits from the near-incident-point region of the specimen in response to injection of the scattered light into the specimen, and the calculation of the characteristic in a remote region located farther from the incident position than the near-incident-point region is based on information carried by light which exits from the remote region in response to injection of the unscattered light into the specimen.
申请公布号 US2007073157(A1) 申请公布日期 2007.03.29
申请号 US20060523501 申请日期 2006.09.20
申请人 FUJI PHOTO FILM CO., LTD. 发明人 SENDAI TOMONARI
分类号 A61B5/00 主分类号 A61B5/00
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