发明名称 |
Method of testing a substrate and apparatus for performing the same |
摘要 |
A method of testing a substrate may involve photographing a first chip on a first face of the substrate to obtain a first image of the first chip, and photographing a second chip on a second face of the substrate opposite to the first face without reversing the substrate to obtain a second image of the second chip. The normality of the first and the second chips may be determined based on the first and the second images.
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申请公布号 |
US2007072467(A1) |
申请公布日期 |
2007.03.29 |
申请号 |
US20060525971 |
申请日期 |
2006.09.25 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
LEE YOUNG-SOO;LEE DONG-CHUN;HAN SEONG-CHAN;BANG HYO-JAE |
分类号 |
H01R29/00 |
主分类号 |
H01R29/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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