| 摘要 |
<P>PROBLEM TO BE SOLVED: To provide an apparatus for inspecting a light emitting diode which can conduct accurate inspection. <P>SOLUTION: Light emitting diodes are vertically pinched by a conductive pin 3 and a retaining member 6, so that even if a stage 2 is lowered by a driving mechanism 5 to pull a carrier 1 away from light emitting diodes LD, each of the light emitting diodes LD is supported by the conductive pin 3 and the retaining member 6. While DC voltages are applied to terminals of the light emitting diodes LD to generate heat in an LED chip 10, only the conductive pin 3 and the retaining member 6 are in contact with the light emitting diodes LD and a thermal conduction route is reduced. Furthermore, the retaining member 6 is made of a synthetic resin material with low thermal conductivity, so that an influence of the retaining member 6 on the temperature measurement of the LED chip 1 can be reduced for accurate inspection. <P>COPYRIGHT: (C)2007,JPO&INPIT |
