发明名称 INSULATED GATE TRANSISTOR INCORPORATING DIODE
摘要 A p-type base layer shaped like a well is formed for each of IGBT cells, and a p<SUP>+</SUP>-type collector layer and an n<SUP>+</SUP>-type cathode layer are formed on a surface opposite to a surface on which the p-type base layer is formed so as to be situated just below the p-type base layer. The p-type base layer of each of the IGBT cells includes a flat region including an emitter region and a bottom surface penetrated by a main trench, and first and second side diffusion regions between which the flat region is interposed. The first side diffusion region is situated just above the n<SUP>+</SUP>-type cathode layer and each of the bottom surfaces of the side diffusion regions forms a parabola-shaped smooth curve in longitudinal section. By replacing the p<SUP>+</SUP>-type collector layer with the n<SUP>+</SUP>-type cathode layer, it is possible to apply features of the above structure to a power MOSFET.
申请公布号 US2007069287(A1) 申请公布日期 2007.03.29
申请号 US20060558764 申请日期 2006.11.10
申请人 MITSUBISHI DENKI KABUSHIKI KAISHA 发明人 TAKAHASHI HIDEKI
分类号 H01L21/28;H01L29/94;H01L21/331;H01L21/336;H01L27/04;H01L29/06;H01L29/41;H01L29/739;H01L29/78;H02M7/5387 主分类号 H01L21/28
代理机构 代理人
主权项
地址