发明名称 Board for probe card, inspection apparatus, photo-fabrication apparatus and photo-fabrication method
摘要 A photo-fabrication apparatus ( 1 ) has a stage ( 2 ) for holding a base board ( 9 ) thereon, a feeding part ( 3 ) for feeding photosensitive material onto the base board ( 9 ), a layer forming part ( 4 ) for smoothly spreading the fed photosensitive material to form a material layer and a light emitting part ( 5 ) for emitting a spatially-modulated light beam onto the material layer. The photo-fabrication apparatus ( 1 ) forms a lot of elastic microstructures for fine probe and arranges the microstructures at microscopic intervals in a very small range with high positional accuracy on the base board ( 9 ) by repeating formation of a material layer and light emission. The microstructures become elastic probes through plating in a later process.
申请公布号 US2007069744(A1) 申请公布日期 2007.03.29
申请号 US20040557714 申请日期 2004.05.10
申请人 KOYAGI YASUYUKI;SHIMOZUMA HIROKO;TANABE TAKAYOSHI;YASHIRO TAKAO 发明人 KOYAGI YASUYUKI;SHIMOZUMA HIROKO;TANABE TAKAYOSHI;YASHIRO TAKAO
分类号 G01R31/02;G01R1/073;G01R3/00;H01L21/66;H05K3/00 主分类号 G01R31/02
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