发明名称 |
Board for probe card, inspection apparatus, photo-fabrication apparatus and photo-fabrication method |
摘要 |
A photo-fabrication apparatus ( 1 ) has a stage ( 2 ) for holding a base board ( 9 ) thereon, a feeding part ( 3 ) for feeding photosensitive material onto the base board ( 9 ), a layer forming part ( 4 ) for smoothly spreading the fed photosensitive material to form a material layer and a light emitting part ( 5 ) for emitting a spatially-modulated light beam onto the material layer. The photo-fabrication apparatus ( 1 ) forms a lot of elastic microstructures for fine probe and arranges the microstructures at microscopic intervals in a very small range with high positional accuracy on the base board ( 9 ) by repeating formation of a material layer and light emission. The microstructures become elastic probes through plating in a later process.
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申请公布号 |
US2007069744(A1) |
申请公布日期 |
2007.03.29 |
申请号 |
US20040557714 |
申请日期 |
2004.05.10 |
申请人 |
KOYAGI YASUYUKI;SHIMOZUMA HIROKO;TANABE TAKAYOSHI;YASHIRO TAKAO |
发明人 |
KOYAGI YASUYUKI;SHIMOZUMA HIROKO;TANABE TAKAYOSHI;YASHIRO TAKAO |
分类号 |
G01R31/02;G01R1/073;G01R3/00;H01L21/66;H05K3/00 |
主分类号 |
G01R31/02 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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