发明名称 Method and device for synchronous mapping
摘要 An instrument for measuring aberration refraction of an eye is provided, having: a lens system defining an instrument optical axis and an alignment device for aligning the visual axis of the eye with the instrument optical axis. A light source ( 1 ) produces a probing beam that is projected through the lens system parallel to the instrument optical axis and is selectably positionable partially off-set from the instrument optical axis for entering the eye ( 15 ) parallel to the instrument optical axis at a plurality of locations on the cornea of the eye. A photodetector ( 19 ) measures the position of probing beam light scattered back from the retina of the eye to measure aberration refraction of the eye at a plurality of locations.
申请公布号 AU2001294998(B2) 申请公布日期 2007.03.29
申请号 AU20010294998 申请日期 2001.08.08
申请人 TRACEY TECHNOLOGIES, LLC 发明人 IOANNIS PALLIKARIS;SERGIY MOLEBNY;YOUSSEF WAKIL;VASYL MOLEBNY
分类号 A61B3/10;A61B3/103;A61B3/107 主分类号 A61B3/10
代理机构 代理人
主权项
地址
您可能感兴趣的专利