| 摘要 |
PROBLEM TO BE SOLVED: To efficiently calculate a saving solution for replacing a defective memory cell by a spare cell. SOLUTION: The testing device includes: a plurality of testing signal supply parts disposed correspondingly to memories to be tested to supply testing signals for testing the memories to be tested to the memories to be tested; a plurality of defect detection parts disposed correspondingly to the memories to be tested to detect defects of the memories to be tested; a plurality of first analysis parts disposed correspondingly to the memories to be tested to replace the defective memory cell among the memories to be tested by the spare cell of the memories to be tested, thereby solving the defect of the memories to be tested; and a second analysis part for taking over the analysis processing of the saving solution from the first analysis part where the analysis of saving solution is not finished to obtain the saving solution in accordance with starting of saving solution analysis for the plurality of memories to be tested different from one another by the plurality of first analysis parts. COPYRIGHT: (C)2007,JPO&INPIT
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