发明名称 SEMICONDUCTOR INTEGRATED CIRCUIT, INSPECTING APPARATUS AND SEMICONDUCTOR INTEGRATED CIRCUIT INSPECTING METHOD
摘要 <p>A semiconductor integrated circuit including: a circuit function section; a bus connected to the circuit function section; an information fetch register for fetching data flowing over the bus; and a radio communicating circuit for transmitting the data fetched into the information fetch register by wireless.</p>
申请公布号 EP1767954(A1) 申请公布日期 2007.03.28
申请号 EP20050760152 申请日期 2005.07.08
申请人 SEIKO EPSON CORPORATION 发明人 IIDA, IZUMI;INOGUCHI, MAKOTO
分类号 G01R31/28 主分类号 G01R31/28
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