发明名称 |
SEMICONDUCTOR INTEGRATED CIRCUIT, INSPECTING APPARATUS AND SEMICONDUCTOR INTEGRATED CIRCUIT INSPECTING METHOD |
摘要 |
<p>A semiconductor integrated circuit including:
a circuit function section;
a bus connected to the circuit function section;
an information fetch register for fetching data flowing over the bus; and
a radio communicating circuit for transmitting the data fetched into the information fetch register by wireless.</p> |
申请公布号 |
EP1767954(A1) |
申请公布日期 |
2007.03.28 |
申请号 |
EP20050760152 |
申请日期 |
2005.07.08 |
申请人 |
SEIKO EPSON CORPORATION |
发明人 |
IIDA, IZUMI;INOGUCHI, MAKOTO |
分类号 |
G01R31/28 |
主分类号 |
G01R31/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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