发明名称 High-voltage MOS transistor
摘要 A method for fabricating a high-voltage MOS transistor. A first doping region with a first dosage is formed in a substrate. A gate structure is formed overlying the substrate and partially covers the first doping region. The substrate is ion implanted using the gate structure as a mask to simultaneously form a second doping region with a second dosage within the first doping region to serve as a drain region and form a third doping region with the second dosage in the substrate to serve as a source region. A channel region is formed in the substrate between the first and third doping regions when the high-voltage MOS transistor is turned on to pass current between the source and drain regions, where a resistance per unit length of the channel region is substantially equal to that of the first doping region. A high-voltage MOS transistor is also disclosed.
申请公布号 US7196375(B2) 申请公布日期 2007.03.27
申请号 US20040801234 申请日期 2004.03.16
申请人 TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD. 发明人 CHEN FU-HSIN;LIU RUEY-HSIN
分类号 H01L29/76;H01L21/336;H01L21/822;H01L29/94 主分类号 H01L29/76
代理机构 代理人
主权项
地址
您可能感兴趣的专利