发明名称 SEMICONDUCTOR INTEGRATED CIRCUIT CAPABLE OF COMPENSATING FOR VARIATION OF SOURCE VOLTAGE TO IMPROVE OPERATION RELIABILITY OF ELECTRONIC APPARATUS
摘要 A bias generation circuit is between a power voltage node and ground voltage node at a far end from power voltage and ground voltage terminals. Reference voltage nodes are connected to an amplifier circuit block from the far end. The amplifier block is closer to the power supply source, and the bias generation circuit is distant therefrom. Even if the power supply voltage drops due to current constantly flowing in the amplification block and bias generation circuit, the bias generation circuit generates reference voltages at the reference voltage nodes based on the voltage-dropped power supply. Therefore, the voltage in the constant current source MOS transistor of the amplifier block becomes lowest at the amplifier circuit closest to the bias generation circuit. The response speeds of other amplifier circuits do not drop if the circuit is designed based on the amplifier closest to the bias generation circuit.
申请公布号 KR20070033886(A) 申请公布日期 2007.03.27
申请号 KR20060087375 申请日期 2006.09.11
申请人 发明人
分类号 G09G3/36;G02F1/133 主分类号 G09G3/36
代理机构 代理人
主权项
地址