发明名称 Method of manufacturing silicon carbide semiconductor device
摘要 A manufacturing method for forming a region into which impurity ions are implanted, and an electrode is coupled to the region, in a self-aligned manner. An oxide film is formed on an n-type semiconductor layer composed of a silicon carbide semiconductor, and then the oxide film on regions in which source and drain regions are to be formed is removed by etching. Impurity ions are implanted into an exposed semiconductor layer and heat treatment is performed for activating the implanted impurity ions. A metal film to serve as ohmic electrodes is formed on the entire surface, and then the oxide film is removed by etching to thereby form a source electrode and a drain electrode. Leaving a part of the oxide film on regions on which source and drain electrodes are to be formed can prevent the oxide film from being deformed during the heat treatment for activation.
申请公布号 US7195996(B2) 申请公布日期 2007.03.27
申请号 US20050199140 申请日期 2005.08.09
申请人 NEW JAPAN RADIO CO., LTD. 发明人 ARAI MANABU;SAWAZAKI HIROSHI
分类号 H01L21/28 主分类号 H01L21/28
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